En poursuivant votre navigation, vous acceptez l'utilisation de cookies destinés à améliorer la performance de ce site et à vous proposer des services et contenus personnalisés.

X

Onglets principaux

Photo personnelle
Ossikovski Razvigor
CHERCHEUR

Contact

Bureau : 4:10-14
Téléphone : +33169334367
Département/Laboratoire/Service : CA/DER/LAB/PICM
Fonctions complémentaires :
PROFESSEUR
+33169334367
EXAMINATEUR EV2 2015
EXAMINATEUR FUI

Bibliographie & travail en cours

Mission: 

Professor (Department of Physics)

Researcher (Laboratory of Physics of Interfaces and Thin Films, LPICM)

Entrance examiner (French and international tracks)

Topical editor of Optics Letters (polarization)

Biographie: 

Razvigor Ossikovski was born in Rousse (Bulgaria) in 1967. He received his engineer degree in Electronics from the Technical University of Rousse, Bulgaria in 1991. He was an international student (X88, PEI) at Ecole Polytechnique, France wherefrom he received his MSc (1991) and PhD (1995) degrees in Physics. He then held R&D engineeer and team leader positions at the companies HORIBA Jobin Yvon, Corning Inc. and HighWave Optical before taking his current academic position as, first, assistant professor (2003) and, after his habilitation, as associate professor (2010) and full professor (2018) at Ecole Polytechnique, LPICM (Laboratory of Physics of Interfaces and Thin Films). His current research interests are the theory of polarimetry (more specifically, Mueller matrix algebra and phenomenologcal models), as well as experimental tip-enhanced Raman spectroscopy (TERS). He has authored or co-authored five patents, one book, three book-chapters and more than 120 publications. He has coordinated or taken part in more than ten national and international research projects.

Enseignement: 

First year lab sessions (PHY106: bachelor programme)

Second year project-oriented lab sessions (PHY473: engineer programme)

Second year joint scientific project (PSC: engineer programme)

Third year course and tutorials on Nanomaterials and electronic applications (PHY564B: master 1 programme)

Recherche: 

Phenomenological description of the linear interaction of polarized light with matter (Mueller matrix algebra). Polarimetry.

Tip-enhanced Raman spectroscopy (TERS). 

Publications et Liens

Publications: 

 

 

Patents

M. Chaigneau, A. Karar, R. Ossikovski, B. Drévillon, Microscope à sonde locale multimode, microscope Raman exalté par pointe et procédé de régulation de la distance entre la sonde locale et l’échantillon, EU 14703140.5 (filed 01/02/2013)

 

R. Ossikovski, B. Drévillon, A. De Martino, Polarimetric Raman system and method for analyzing a sample, EU 06300050.9 (filed 20/01/2006)

 

R. Ossikovski, P. Even, N. Tallaron, Method for modelling optical fiber amplifiers, FR 01/15842 (7/12/2001), US 7151631 (06/12/2006)

 

D. Chowdhury, E. Murphy, R. Ossikovski, D. Sobiski, All-fiber polarization mode dispersion compensator, US 6556732 (29/04/2003)

 

B. Drévillon, R. Ossikovski, J.-Y. Parey, Modulated spectroscopic ellipsometry, FR 55281 (12/01/1994), US 5536936 (16/07/1996)

 

 

Books

J. J. Gil, R. Ossikovski, Polarized Light: the Mueller Matrix Approach (CRC Press, 2016)

 

R. Ossikovski, Nanomatériaux et applications électroniques. Huit thèmes choisis (Éditions de l’École polytechnique, 2018)

 

 

Book chapters

M. Chaigneau, G. M. Vanacore, M. Bollani, G. Picardi, A. Tagliaferri, R. Ossikovski, 20-nm-resolved stress profile in SiGe nano-stripes obtained by tip enhanced Raman spectroscopy, in Handbook of Enhanced Spectroscopy, P. Gucciardi, M. Lamy de la Chapelle and N. Lidgi-Guigui eds. (Pan Stanford, Singapore, 2016)

 

E. Garcia-Caurel, R. Ossikovski, M. Foldyna, A. Pierangelo, A. De Martino, B. Drévillon, Advanced Mueller ellipsometry instrumentation and data analysis, in Ellipsometry at the Nanoscale, M. Losurdo and K. Hingerl eds. (Springer, Heidelberg, 2013)

 

P. G. Gucciardi, M. Lamy de la Chapelle, J.-C. Valmalette, G. Picardi, R. Ossikovski, Polarization-sensitive tip enhanced Raman scattering, in Scanning Probe Microscopy in Nanoscience and Nanotechnology, B. Bhushan ed. (Springer, Heidelberg, 2010)

 

 

Journal papers

A. Elbaz, N. von den Driesch, K Pantzas, G. Patriarche, N. Zerounian, E. Herth, X. Checoury, S. Sauvage, I. Sagnes, A. Foti, R. Ossikovski, J.-M. Hartmann, F. Boeuf, Z. Ikonic, D. Grützmacher, P. Boucaud, D. Buca, M. El Kurdi, Ultra-low threshold cw and pulsed lasing in tensile strained GeSn alloys, Nature Photonics (2020)

 

I. San José, J. J. Gil, R. Ossikovski, Algorithm for the numerical calculation of the serial components of the normal form of depolarizing Mueller matrices, Appl. Opt. 59, 2291 (2020)

 

H. R. Lee, C. Lotz, F. Kai Groeber-Becker, S. Dembski, E. Garcia-Caurel, R. Ossikovski, T. Novikova, Tissue phantom analysis through differential Mueller matrix formalism: a concise review, Asian J. Phys. 29, 1 (2020)

 

J. Tian, H. Yao, M. Cavillon, E. Garcia-Caurel, R. Ossikovski, M. Stchakovsky, C. Eypert, B. Poumellec, M. Lancry, A comparison between nanogratings-based and stress-engineered waveplates written by fs laser in silica, Micromashines 11, 131 (2020)

 

P. Li, H. R. Lee, S. Chandel, C. Lotz, F. K. Groeber-Becker, S. Dembski, R. Ossikovski, H. Ma, T. Novikova, Analysis of tissue microstructure with Mueller microscopy: logarithmic decomposition and Monte Carlo modeling, J. Biomed. Opt. 25, 015002 (2020)

 

M. Richard, A. Al-Ajaji, S. Ren, A. Foti, J. Tran, M. Frigoli, B. Gusarov, Y. Bonnassieux, E. Garcia Caurel, P. Bulkin, R. Ossikovski, A. Yassar, Large-scale patterning of π-conjugated materials by meniscus-guided coating methods, Adv. Colloid Interface Sci. 275, 102080 (2020)

 

A. Foti, C. Toccafondi, R. Ossikovski, Study of the molecular bending in azobenzene self-assembled monolayers observed in STM-TERS, J. Phys. Chem. C 123, 26554 (2019)

 

R. Ossikovski, O. Arteaga, Completing an experimental nondepolarizing Mueller matrix whose column or row is missing, J. Vac. Sci. Technol. B 37, 052905 (2019)

 

H. R. Lee, P. Li, T. S. H. Yoo, C. Lotz, F. K. Groeber-Becker, S. Dembski, E. Garcia-Caurel, R. Ossikovski, H. Ma, T. Novikova, Digital histology of tissue with Mueller microscopy: how to mitigate an impact of tissue cut thickness fluctuations, J. Biomed. Opt. 24, 076004 (2019)

 

R. Ossikovski, J. Vizet, Eigenvalue-based depolarization metrics spaces for Mueller matrices, J. Opt. Soc. Am. A 36, 1173 (2019)

 

R. Ossikovski, M. Ali Kuntman, O. Arteaga, Anisotropic integral decomposition of depolarizing Mueller matrices, OSA Continuum 2, 1900 (2019)

 

J. Tian, R. Li, S. H. Yoo, B. Poumellec, E. Garcia-Caurel, R. Ossikovski, M. Stchakovsky, C. Eypert, J. Canning, M. Lancry, Spectral dependence of femtosecond laser-induced circular optical properties in silica, OSA Continuum 2, 1233 (2019)

 

R. Ossikovski, O. Arteaga, Instrument-dependent method for obtaining a nondepolarizing estimate from an experimental Mueller matrix, Opt. Eng. 58, 082409 (2019)

 

R. Ossikovski, O. Arteaga, Complete Mueller matrix from a partial polarimetry experiment: the nine-element case, J. Opt. Soc. Am. A 36, 403 (2019)

 

O. Arteaga, R. Ossikovski, Complete Mueller matrix from a partial polarimetry experiment: the 12-element case, J. Opt. Soc. Am. A 36, 416 (2019)

 

O. Arteaga, Z. El-Hachemi, R. Ossikovski, Snapshot circular dichroism measurements, Opt. Express 27, 6746 (2019)

 

O. Arteaga, E. Garcia-Caurel, R. Ossikovski, A Stern-Gerlach experiment with light: separating photons by spin with the method of A. Fresnel, Opt. Express 27, 4758 (2019)

 

L. Borromeo, C. Toccafondi, M. Minde, U. Zimmermann, S. Andò, M. Madland, R. Korsnes, R. Ossikovski, Application of Tip-Enhanced Raman Spectroscopy for the nanoscale characterization of flooded chalk, J. Appl. Phys. 124, 173101 (2018)

 

M. Al-Ghzaiwat, A. Foti, A. Nuesslein, L. Halagačka, J. Méot, A. Labouret, R. Ossikovski, P. Roca i Cabarrocas, M. Foldyna, Towards efficient radial junction silicon nanowire-based solar mini-modules, Phys. Status Solidi RRL 1800402 (2018)

 

M. Kupinski, M. Boffety, F. Goudail, R. Ossikovski, A. Pierangelo, J. Rehbinder, J. Vizet, T. Novikova, Polarimetric measurement utility for pre-cancer detection from uterine cervix specimens, Biomed. Opt. Express 9, 5691 (2018)

 

J. Vizet, R. Ossikovski, Symmetric decomposition of experimental Mueller matrices in the degenerate case, Appl. Opt. 57, 1159 (2018)

 

R. Ossikovski, O. Arteaga, S. H. Yoo, E. Garcia-Caurel, K. Hingerl, Experimental evidence for partial spatial coherence in imaging Mueller polarimetry, Opt. Lett. 42, 4740 (2017)

 

R. Ossikovski, J. Vizet, Polar decompositions of negative-determinant Mueller matrices featuring non-diagonal depolarizers, Appl. Opt. 56, 8446 (2017)

 

J. Tian, M. Lancry, S. H. Yoo, E. Garcia-Caurel, R. Ossikovski, B. Poumellec, Study of femtosecond-laser-induced circular optical properties by Mueller matrix spectropolarimetry, Opt. Lett. 42, 4103 (2017)

 

A. van Eeckhout, A. Lizana, E. Garcia-Caurel, J. J. Gil, R. Ossikovski, J. Campos, Characterization of depolarizing samples based on the indices of polarimetric purity, Opt. Lett. 42, 4155 (2017)

 

O. Arteaga, R. Ossikovski, E. Kuntman, M. A. Kuntman, A. Canillas, E. Garcia-Caurel, Mueller matrix polarimetry on a Young’s double slit experiment analogue, Opt. Lett. 42, 3900 (2017)

 

R. Ossikovski, O. Arteaga, Extended Yeh’s method for optically active anisotropic layered media, Opt. Lett. 42, 3690 (2017)

 

R. Ossikovski, J. J. Gil, Basic properties and classification of Mueller matrices derived from their statistical definition, J. Opt. Soc. Am. A 34, 1727 (2017)

 

R. Ossikovski, O. Arteaga, J. Vizet, E. Garcia-Caurel, On the equivalence between Young’s double-slit and crystal double-refraction interference experiments, J. Opt. Soc. Am. A 34, 1309 (2017)

 

S. H. Yoo, R. Ossikovski, E. Garcia-Caurel, Experimental study of thickness dependence of the polarization and depolarization properties of anisotropic turbid media using Mueller matrix polarimetry and differential decomposition, Appl. Surf. Sci. 421, 870 (2017)

 

M. Miranda-Medina, E. Garcia-Caurel, A. Peinado, M. Stchakovsky, K. Hingerl, R. Ossikovski, Experimental validation of the partial coherence model in spectroscopic ellipsometry and Mueller matrix polarimetry, Appl. Surf. Sci. 421, 656 (2017)

 

C. Toccafondi, G. Picardi, R. Ossikovski, Molecular bending at the nanoscale evidenced by STM-TERS on thiol self-assembled monolayers, J. Phys. Chem. C 120, 18209 (2016) 

 

E. Everaere, E. Colin-Koeniguer, L. Thirion-Lefèvre, J. Tran, C. Sorin-Cojocaru, A. De Martino, R. Ossikovski, Optical scale polarimetric device for nanotube forest measurement: an opportunity to anticipate bistatic polarimetric SAR images of tree trunk forests at P-band, IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing (J-STARS) 9, 3249 (2016)

 

R. Ossikovski, K. Hingerl, General formalism for partial spatial coherence in reflection Mueller matrix polarimetry, Opt. Lett. 41, 4044 (2016)

 

R. Ossikovski, E. Garcia-Caurel, Explicit expressions for the elementary polarization properties of a weakly anisotropic, homogeneous medium, Opt. Lett. 41, 3487 (2016)

 

H. Arwin, A. Mendoza-Galván, R. Magnusson, A. Andersson, J. Landin, K. Järrendahl, E. Garcia-Caurel, R. Ossikovski, Structural circular birefringence and dichroism quantified by differential decomposition of spectroscopic transmission Mueller matrices on Cetonia aurata, Opt. Lett. 41, 3293 (2016)

 

M. M. McClarty, N. Jegenyes, M. Gaudet, C. Toccafondi, R. Ossikovski, F. Vaurette, S. Arscott, A. C. H. Rowe, Geometric and surface chemical origin of the piezoresistance in silicon nanowires, Appl. Phys. Lett. 109, 023102 (2016)

 

R. Ossikovski, J. Vizet, Algebraic invariants for reflection Mueller polarimetry via uncompensated double pass illumination-collection optics, Opt. Lett. 41, 3066 (2016)

 

R. Magnusson, H. Arwin, E. Garcia-Caurel, K. Järrendahl, R. Ossikovski, Sum regression decomposition of spectral and angle-resolved Mueller-matrices from biological reflectors, Appl. Opt. 55, 4060 (2016)

 

J. J. Gil, R. Ossikovski, I. San José, Singular Mueller matrices, J. Opt. Soc. Am. A 33, 600 (2016)

 

M. El Kurdi, M. Prost, A. Ghrib, A. Elbaz, S. Sauvage, X. Checoury, G. Beaudoin, I. Sagnes, G. Picardi, R. Ossikovski, F. Boeuf, P. Boucaud, Tensile-strained germanium microdisks with circular Bragg reflectors, Appl. Phys. Lett. 108, 091103 (2016)

 

M. El Kurdi, M. Prost, A. Ghrib, S. Sauvage, X. Checoury, G. Beaudoin, I. Sagnes, G. Picardi, R. Ossikovski, P. Boucaud, Direct bandgap germanium microdisks obtained with silicon nitride stressor layers, ACS Photonics 3, 443 (2016)

 

K. Hingerl, R. Ossikovski, General approach for modeling partial coherence in spectroscopic Mueller matrix polarimetry, Opt. Lett. 41, 219 (2016)

 

N. Agarwal, J. Yoon, E. Garcia-Caurel, T. Novikova, J.-C. Vanel, A. Pierangelo, A. Bykov, A. Popov, I. Meglinski, R. Ossikovski, Spatial evolution of depolarization in homogeneous turbid media within the differential Mueller matrix formalism, Opt. Lett. 40, 5634 (2015)

 

R. Ossikovski, O. Arteaga, Integral decomposition and polarization properties of depolarizing Mueller matrices, Opt. Lett. 40, 954 (2015)

 

H. Arwin, R. Magnusson, E. Garcia-Caurel, C. Fallet, K. Järrendahl, A. De Martino, M. Foldyna, R. Ossikovski, Sum decomposition of Mueller-matrix images and spectra of beetle  cuticles, Opt. Express 23, 1951 (2015)

 

R. Ossikovski, A. De Martino, Differential Mueller matrix of a depolarizing homogeneous medium and its relation to the Mueller matrix logarithm, J. Opt. Soc. Am. A 32, 343 (2015) 

 

A. Ghrib, M. El Kurdi, M. Prost, S. Sauvage, X. Checoury, G. Beaudoin, M. Chaigneau, R. Ossikovski, I. Sagnes, P. Boucaud, All-around SiN stressor for high and homogeneous tensile strain in germanium microdisk cavities, Adv. Opt. Mater. 3, 353 (2015).

 

O. Arteaga, E. Garcia-Caurel, R. Ossikovski, Elementary polarization properties in the backscattering configuration, Opt. Lett. 39, 6050 (2014)

 

R. Ossikovski, E. Garcia-Caurel, M. Foldyna, J. J. Gil, Application of the arbitrary decomposition to finite spot size Mueller matrix measurements, Appl. Opt. 53, 6030 (2014)

 

R. Ossikovski, O. Arteaga, Statistical meaning of the differential Mueller matrix of depolarizing homogeneous media, Opt. Lett. 39, 4470 (2014)

 

V. Devlaminck, R. Ossikovski, Uniqueness of the differential Mueller matrix of uniform homogeneous media, Opt. Lett. 39, 3149 (2014)

 

R. Ossikovski, V. Devlaminck, Simple criterion for the physical realizability of the differential Mueller matrix, Opt. Lett. 39, 1216 (2014)

 

H. Kumar Wickramasinghe, M. Chaigneau, R. Yasukuni, G. Picardi, R. Ossikovski, Billion fold increase in tip enhanced Raman signal, ACS Nano 8, 3421 (2014)

 

G. Picardi, A. Kròlikowska, R. Yasukuni, M. Chaigneau, M. Escude, V. Mourier, C. Licitra, R. Ossikovski, Exchange of methyl and azobenzene terminated alkanethiol on polycrystalline gold studied by tip enhanced Raman mapping, Chem. Phys. Chem. 15, 276 (2014)

 

G. Ndong, G. Picardi, D. Rouchon, C. Licitra, J. Eymery, R. Ossikovski, Determination of the biaxial stress in strained silicon nanostripes through polarized oblique incidence Raman spectroscopy, J. Appl. Phys. 114, 164309 (2013)

 

R. Ossikovski, J. J. Gil, I. San José, Poincaré sphere mapping by Mueller matrices, J. Opt. Soc. Am. A 30, 2291 (2013)

 

G. M. Vanacore, M. Chaigneau, N. Barrett, M. Bollani, F. Boioli, M. Salvalaglio, F. Montalenti, N. Manini, L. Caramella, P. Biagioni, D. Chrastina, G. Isella, O. Renault, M. Zani, R. Sordan, G. Onida, R. Ossikovski, H.-J. Drouhin, A. Tagliaferri, Hydrostatic strain enhancement in laterally confined SiGe nano-stripes, Phys. Rev. B 88, 115309 (2013)

 

M. Chaigneau, E. V. Johnson, L. Kroely, P. Roca-i-Cabarrocas, R. Ossikovski, Polarized Raman spectroscopy analysis of SiHx bonds in nanocrystalline silicon thin films, Thin Solid Films 537, 145 (2013)

 

P. Boucaud, M. El Kurdi, A. Ghrib, M. Prost, M. de Kersauson, S. Sauvage, F. Aniel, X. Checoury, G. Beaudoin, L. Largeau, I. Sagnes, G. Ndong, M. Chaigneau, R. Ossikovski, Recent advances in germanium emission, Photon. Res. 1, 102 (2013)

 

M. de Kersauson, M. Prost, A. Ghrib, M. El Kurdi, S. Sauvage, G. Beaudoin, L. Largeau, O. Mauguin, R. Jakomin, I. Sagnes, G. Ndong, M. Chaigneau, R. Ossikovski, P. Boucaud, Effect of increasing thickness on tensile-strained germanium grown on InGaAs buffer layers, J. Appl. Phys. 113, 183508 (2013)

 

H. Hu, R. Ossikovski, F. Goudail, Performance of maximum likelihood estimation of Mueller matrices taking into account physical realizability and Gaussian or Poisson noise statistics, Opt. Express 21, 5117 (2013)

 

G. Ndong, G. Picardi, M. Chaigneau, R. Ossikovski, Retardation assisted enhanced Raman scattering from silicon nanostripes in the visible range, Nanotechnology 24, 035705 (2013)

 

J. J. Gil, I. San José, R. Ossikovski, Serial-parallel decompositions of Mueller matrices, J. Opt. Soc. Am. A 30, 32 (2013)

 

R. Ossikovski, G. Picardi, G. Ndong, M. Chaigneau, Raman spectroscopy and polarization: selected case studies, C. R. Physique 13, 837 (2012)

 

S. Kumar, H. Purwar, R. Ossikovski, I. Alex Vitkin, N. Ghosh, Comparative study of differential matrix and extended polar decomposition formalisms for polarimetric characterization of complex tissue-like turbid media, J. Biomed. Opt. 17, 105006 (2012)

 

M. Chaigneau, G. Picardi, H. A. Girard, J.-C. Arnault, R. Ossikovski, Laser heating versus phonon confinement effect in the Raman spectra of diamond nanoparticles, J. Nanopart. Res. 14, 955 (2012)

 

A. Ghrib, M. de Kersauson, M. El Kurdi, R. Jakomin, G. Beaudoin, S. Sauvage, G. Fishman, G. Ndong, M. Chaigneau, R. Ossikovski, I. Sagnes, P. Boucaud, Control of tensile strain in germanium waveguides through silicon nitride layers, Appl. Phys. Lett. 100, 201104 (2012)

 

R. Ossikovski, Retrieval of a nondepolarizing estimate from an experimental Mueller matrix through virtual experiment, Opt. Lett. 37, 578 (2012)

 

R. Ossikovski, Differential and product Mueller matrix decompositions: a formal comparison, Opt. Lett. 37, 220 (2012)

 

N. Ortega-Quijano, B. Haj-Ibrahim, E. Garcia-Caurel, J.L. Arce-Diego, R. Ossikovski, Experimental validation of Mueller matrix differential decomposition, Opt. Express 20, 1151 (2012)

 

R. Ossikovski, Differential matrix formalism for depolarizing anisotropic media, Opt. Lett. 36, 2330 (2011)

 

O. Arteaga, E. Garcia-Caurel, R. Ossikovski, Anisotropy coefficients of a Mueller matrix, J. Opt. Soc. Am. A 28, 548 (2011)

 

R. Jakomin, M. de Kersauson, M. El Kurdi, L. Largeau, O. Mauguin, G. Beaudoin, S. Sauvage, R. Ossikovski, G. Ndong, M. Chaigneau, I. Sagnes, P. Boucaud, High quality tensile-strained n-doped germanium thin films grown on InGaAs buffer layers, Appl. Phys. Lett. 98, 091901 (2011)

 

M. Chaigneau, G. Picardi, R. Ossikovski, Molecular arrangement in self-assembled azobenzene-containing thiol monolayers at the individual domain level studied through polarized near-field Raman spectroscopy, Int. J. Mol. Sci. 12, 1245 (2011)

 

R. Ossikovski, Alternative depolarization indices for Mueller matrices, J. Opt Soc. Am. A 27, 808 (2010)

 

M. Chaigneau, G. Picardi, R. Ossikovski, Tip enhanced Raman imaging of amorphous carbon contaminations on gold surfaces, Surf. Sci. 604, 701 (2010)

 

C. Fallet, A. Pierangelo, R. Ossikovski, A. De Martino, Experimental validation of the symmetric decomposition of Mueller matrices, Opt. Express 18, 831 (2010)

 

R. Ossikovski, Canonical forms of depolarizing Mueller matrices, J. Opt. Soc. Am. A 27, 123 (2010)

 

A. Merlen, J.-C. Valmalette, P. Gucciardi, M. Lamy de la Chapelle, A. Frigout, R. Ossikovski, Depolarization effects in tip enhanced Raman spectroscopy, J. Raman Spectrosc.  40, 1361 (2009)

 

G. Picardi, M. Chaigneau, R. Ossikovski, C. Licitra, G. Delapierre, Tip enhanced Raman spectroscopy on azobenzene thiol self-assembled monolayers on Au(111), J. Raman Spectrosc. 40, 1407 (2009)

 

R. Ossikovski, M. Foldyna, C. Fallet, A. De Martino, Experimental evidence for naturally occurring nondiagonal depolarizers, Opt. Lett. 34, 2426 (2009)

 

M. Foldyna, E. Garcia-Caurel, R. Ossikovski, A. De Martino, J.J. Gil, Retrieval of a non- depolarizing component out of a depolarizing Mueller matrix, Opt. Express 17, 12794 (2009)

 

M. Losurdo, M. Bergmair, G. Bruno, D. Cattelan, C. Cobet, A. De Martino, K. Fleischer, Z. Dohcevic-Mitrovic, N. Esser, M. Gaillet, R. Gajic, D. Hemzal, K. Hingerl, J. Humlicek, R. Ossikovski, Z. V. Popovic, O. Saxl, Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives, J. Nanopart. Res. 11, 1521 (2009)

 

I. Stenger, A. Frigout, D. Tondelier, B. Geffroy, R. Ossikovski, Y. Bonnassieux, Polarized micro-Raman spectroscopy study of pentacene thin films, Appl. Phys. Lett. 94, 133301 (2009)

 

R. Ossikovski, Analysis of depolarizing Mueller matrices through a symmetric decomposition, J. Opt. Soc. Am. A 26, 1109 (2009)

 

R. Ossikovski, C. Fallet, A. Pierangelo, A. De Martino, Experimental implementation and properties of Stokes nondiagonalizable depolarizing Mueller matrices, Opt. Lett. 34, 974 (2009)

 

G. Picardi, M. Chaigneau, R. Ossikovski, High resolution probing of multiwall carbon nanotubes by tip enhanced Raman spectroscopy in gap-mode, Chem. Phys. Lett. 469, 161 (2009)

 M. Foldyna, A. De Martino, R. Ossikovski, E. Garcia-Caurel, C. Licitra, Characterization of grating structures by Mueller polarimetry in presence of strong depolarization due to finite spot size, Opt. Commun. 282, 735 (2009)

 

R. Ossikovski, Estimation of polarization mode dispersion and polarization dependent loss in a cascade of optical components, Eur. Phys. J. Appl. Phys. 44, 155 (2008)

 

R. Ossikovski, Q. Nguyen, G. Picardi, J. Schreiber, P. Morin, Theory and experiment of large numerical aperture objective Raman microscopy: application to the stress tensor determination in strained cubic materials, J. Raman Spectrosc. 39, 661 (2008)

 

R. Ossikovski, Q. Nguyen, G. Picardi, J. Schreiber, Determining the stress tensor in strained semiconductor structures by using polarized micro-Raman spectroscopy in oblique backscattering configuration, J. Appl. Phys. 103, 093525 (2008)

 

M. Foldyna, A. De Martino, E. Garcia-Caurel, R. Ossikovski, C. Licitra, F. Bertin, K. Postava, B. Drévillon, Critical dimensions of biperiodic gratings determined by spectral
ellipsometry and Mueller matrix polarimetry, Eur. Phys. J. Appl. Phys. 42, 351 (2008)

 

M. Foldyna, A. De Martino, E. Garcia-Caurel, R. Ossikovski, F. Bertin, J. Hazart, K. Postava, B. Drévillon, Monitoring of critical dimensions of 2D gratings by spectral ellipsometry and Mueller matrix polarimetry, phys. stat. sol. (a) 205, 806 (2008)

 

R. Ossikovski, M. Anastasiadou, S. Ben Hatit, E. Garcia-Caurel, A. De Martino, Depolarizing Mueller matrices: how to decompose them, phys. stat. sol. (a) 205, 720 (2008)

 

R. Ossikovski, E. Garcia-Caurel, A. De Martino, Product decompositions of experimentally determined non-depolarizing Mueller matrices, phys. stat. sol. (c) 5, 1059 (2008)

 

R. Ossikovski, M. Anastasiadou, A. De Martino, Product decompositions of depolarizing Mueller matrices with negative determinants, Opt. Commun. 281, 2406 (2008)

 

R. Ossikovski, Interpretation of non-depolarizing Mueller matrices based on the singular value decomposition, J. Opt. Soc. Am. A 25, 473 (2008)

 

M. Stchakovsky, C. Caillaud, M. Foldyna, R. Ossikovski, E. Garcia-Caurel, Polarimetric characterization of optically anisotropic flexible substrates, Thin Solid Films 516, 1414 (2008)

 

G. Picardi, Q. Nguyen, J. Schreiber, R. Ossikovski, Comparative study of atomic force mode and tunnelling mode tip-enhanced Raman spectroscopy, Eur. Phys. J. Appl. Phys. 40, 197 (2007)

 

G. Picardi, Q. Nguyen, R. Ossikovski, J. Schreiber, Polarization properties of oblique - incidence scanning tunnelling microscopy - tip enhanced Raman spectroscopy, Appl. Spectrosc. 61, 1301 (2007)

 

M. Anastasiadou, S. Ben Hatit, R. Ossikovski, S. Guyot, A. De Martino, Experimental validation of the reverse polar decomposition of depolarizing Mueller matrices, J. Eur. Opt. Soc. Rapid Publ. 2, 07018 (2007)

 

Q. Nguyen, R. Ossikovski, J. Schreiber, Contrast enhancement on crystalline silicon in polarized reflection mode tip-enhanced Raman spectroscopy, Opt. Commun. 274, 231 (2007)

 

R. Ossikovski, A. De Martino, S. Guyot, Forward and reverse product decompositions of depolarizing Mueller matrices, Opt. Lett. 32, 689 (2007)

 

R. Ossikovski, Q. Nguyen, G. Picardi, Simple model for the polarization effects in tip-enhanced Raman spectroscopy, Phys. Rev. B 75, 045412 (2007)

 

M. Foldyna, K. Postava, R. Ossikovski, A. De Martino, E. Garcia-Caurel, Effective spectral optical functions of lamellar nanogratings, J. Eur. Opt. Soc. Rapid Publ. 1, 06015 (2006)

M. Foldyna, R. Ossikovski, A. De Martino, B. Drévillon, K. Postava, D. Ciprian, J. Pistora, K. Watanabe, Effective medium approximation of anisotropic lamellar nanogratings based on Fourier factorization, Opt. Express 14, 3114 (2006)

 

T. Novikova, A. De Martino, R. Ossikovski, B. Drévillon, Metrological applications of Mueller polarimetry in conical diffraction for overlay characterization in microelectronics, Eur. Phys. J. Appl. Phys. 31, 63 (2005)

 

K. Postava, A. Maziewski, T. Yamaguchi, R. Ossikovski, S. Visnovsky, J. Pistora, Null ellipsometer with phase modulation, Opt. Express 12, 6040 (2004)

 

H. Touir, M. Stchakovsky, R. Ossikovski, M. Warenghem, Coherent and incoherent interference modelling and measurement of anisotropic multilayer stacks using conventional ellipsometry, Thin Solid Films 455-456, 628 (2004)

 

R. Ossikovski, M. Stchakovsky, M. Kildemo, M. Mooney, Incoherent reflection model for spectroscopic ellipsometry of a thick semi-transparent anisotropic substrate, Appl. Opt. 39, 2071 (2000)

 

M. Kildemo, R. Ossikovski, M. Stchakovsky, Measurement of the absorption edge of thick transparent substrates using the incoherent reflection model and spectroscopic UV-visible-near-IR ellipsometry, Thin Solid Films 313-314, 108 (1998)

 

R. Ossikovski, B. Drévillon, Infrared ellipsometry evidence of disorder-induced vibrational frequency shifts in hydrogenated-amorphous-silicon thin films, Phys. Rev. B 54, 10530 (1996)

 

R. Ossikovski, B. Drévillon, M. Firon, Infrared ellipsometry study of the thickness-dependent vibration frequency shifts in silicon dioxide films, J. Opt. Soc. Am. A 12, 1797 (1995)

 

R. Darwich, P. Roca-i-Cabarrocas, S. Vallon, R. Ossikovski, P. Morin, K. Zellama, Observation by infrared transmission spectroscopy and infrared ellipsometry of a new hydrogen bond during light soaking of a-Si:H, Phil. Mag. B 72, 363 (1995)

 

R. Vanderhagen, S. Cueille, B. Drévillon, R. Ossikovski, Modulated photoellipsometry. Application to the measurement of GaAs internal field, phys. stat. sol. (a) 152, 85 (1995)

 

R. Ossikovski, N. Blayo, B. Drévillon, M. Firon, B. Delahaye, A. Mayeux, Determination of the composition and thickness of of borophosphosilicate glass films, Appl. Phys. Lett. 65, 1236 (1994)

 

H. Shirai, R. Ossikovski, B. Drévillon, In situ study of the interfaces between plasma-deposited amorphous silicon and silicon dioxide by UV-IR ellipsometry, Jpn. J. Appl. Phys. 33, 4177 (1994)

 

R. Ossikovski, H. Shirai, B. Drévillon, In situ investigation of amorphous silicon - silicon dioxide interfaces by infrared ellipsometry, Appl. Phys. Lett. 64, 1815 (1994)

 

R. Ossikovski, B. Drévillon, J. Perrin, In situ infrared ellipsometry study of the hydrogen incorporation in p-doped amorphous silicon and p-i interfaces, J. Non-Cryst. Solids 164-166, 107 (1993)

 

R. Ossikovski, H. Shirai, B. Drévillon, In situ investigation of amorphous silicon – silicon dioxide interfaces by infrared ellipsometry, J. Non-Cryst. Solids 164-166, 825 (1993)

 

R. Ossikovski, H. Shirai, B. Drévillon, In situ investigation by infrared ellipsometry of the growth and interfaces of amorphous silicon and related materials, Thin Solid Films 234, 363 (1993)

 

J.-P. Segaud, B. Drévillon, E. Pascual, R. Ossikovski, G. Monnier, L. Rimbourg, Spectroscopic variations of optical constant and emissivity of Pt-Al2O3 cermet thin films, Thin Solid Films 234, 503 (1993)

 

H. Shirai, B. Drévillon, R. Ossikovski, In situ investigation of amorphous silicon / silicon nitride interfaces by infrared ellipsometry, Appl. Phys. Lett. 62, 2833 (1993)

 

 

Conference papers

A. Van Eeckhout, E. Garcia-Caurel, R. Ossikovski, A. Lizana, C. Rodríguez, E. González, J. Campos, Depolarizing spaces for biological tissue classification based on a wavelength combination, Photonics Europe (2020)

 

H. R. Lee, C. Lotz, F. K. Groeber-Becker, S. Dembski, E. Garcia-Caurel, R. Ossikovski, T. Novikova, Mueller microscopy of full thickness skin models combined with image segmentation, SPIE Proc. vol. 11076, Advances in Microscopic Imaging II, 1107615 (2019)

 

M. Kupinski, M. Boffety, R. Ossikovski, A. Pierangelo, J. Rehbinder, J. Vizet, F. Goudail, T. Novikova, Diagnostics of high grade cervical intraepithelial neoplasia with Mueller matrix polarimetry, SPIE Proc. vol. 11075, Novel Biophotonics Techniques and Applications V, 1107509 (2019)

 

D. Ivanov, R. Ossikovski, T. Novikova, P. Li, E. Borisova, T. Genova, L. Nedelchev, D. Nazarova, Tissue polarimetric study I: In search of reference parameters and depolarizing Mueller matrix model of ex vivo colon samples, Proc. SPIE vol. 11075, Novel Biophotonics Techniques and Applications V, 1107514 (2019)

 

T. S. H. Yoo, A. Fernández, F. Moreno, J. M. Saiz, R. Ossikovski, E. Garcia-Caurel, Multimodal imaging Mueller polarimetric microscope to study polarimetric properties of spheroidal microparticles, Proc. SPIE, vol. 10678, Optical Micro- and Nanometrology VII, 106780J (2018)

 

H. R. Lee, T. S. H. Yoo, P. Li, C. Lotz, F. K. Groeber-Becker, S. Dembski, E. Garcia-Caurel, R. Ossikovski, T. Novikova, Mueller microscopy of anisotropic scattering media: theory and

experiments, Proc. SPIE, vol. 10677, Unconventional Optical Imaging, 1067718 (2018)

 

A. Van Eeckhout, A. Lizana, E. Garcia-Caurel, J. J. Gil, A. Sansa, C. Rodríguez, I. Estévez, E. González, H. Zhang, J. C. Escalera, R. Ossikovski, I. Moreno, J. Campos, Indices of polarimetric purity to enhance the image quality in biophotonics applications, Proc. SPIE, vol. 10685, Biophotonics: Photonic Solutions for Better Health Care VI, 106850B (2018)

 

L Borromeo, M Minde, C Toccafondi, U Zimmermann, S Andò, R Ossikovski, A New Frontier Technique for Nano-analysis on Flooded Chalk − TERS (Tip Enhanced Raman Spectroscopy), IOR 2017 - 19th European Symposium on Improved Oil Recovery

 

A. Elbaz, M. El Kurdi, M. Prost, A. Ghrib, S. Sauvage, X. Checoury, F. Aniel, N. Zerounian, G. Picardi, R. Ossikovski, G. Beaudoin, I. Sagnes, F. Boeuf, P. Boucaud, Direct band gap germanium optoelectronics: emitters, detectors, integration, ECS Transactions 75, 177 (2016)

 

M. El Kurdi, M. Prost, A. Ghrib, X. Checoury, S. Sauvage, N. Zerounian, F. Aniel, G. Beaudoin, I. Sagnes, V. Le Thanh, T. Luong, M. Chaigneau, R. Ossikovski, C. Baudot, F. Boeuf, P. Boucaud, Highly-doped, highly-strained germanium and Schottky electroluminescent diodes, ECS Transactions 64, 359 (2014)

 

S. R. Cloude, J. J. Gil, I. San José, R. Ossikovski, Generalized target decomposition theory, Proceedings PolInSAR, ESA SP-713 (2013)

 

M. El Kurdi, M. de Kersauson, A. Ghrib, M. Prost, S. Sauvage, R. Jakomin, G. Beaudoin, O. Mauguin, L. Largeau, I. Sagnes, G. Ndong, M. Chaigneau, R. Ossikovski, P. Boucaud, Strain engineering for optical gain in germanium, ECS Transactions 50, 363 (2012)

 

M. Chaigneau, H. A. Girard, J.-C. Arnault, R. Ossikovski, Thermal effects on the Raman spectra of nanodiamonds, MRS Proceedings, vol. 1282, (2011), DOI: 10.1557 / opl.2011.309

 

R. Ossikovski, Decomposition and interpretation of Mueller matrices, Eur. Phys. J. Web Conf.  5, 04005 (2010)

 

A. Frigout, M. Richert, R. Ossikovski, From polarized to polarimetric Raman spectroscopy, Eur. Phys. J. Web Conf. 5, 06002 (2010)

 

M. Foldyna, A. De Martino, R. Ossikovski, E. Garcia-Caurel, D. Cattelan, C. Licitra, Characterization of inhomogeneous samples by spectroscopic Mueller polarimetry, Proc. SPIE, vol. 7140, 71400J (2008)

 

M. Foldyna, K. Postava, R. Ossikovski, A. De Martino, E. Garcia-Caurel, B. Drévillon, J. Pistora, T. Yamaguchi, Optics of nanogratings, Proc. SPIE, vol. 6609, 660903 (2007)

 

K. Postava, P. Hlubina, A. Maziewski, R. Ossikovski, M Foldyna, O. Zyvotsky, Z. Pistora, S. Visnovsky, T. Yamaguchi, Influence of component imperfection on null ellipsometry with phase modulation, Proc. SPIE, vol. 5856, 143 (2005)

 

P. Even, N. Tallaron, A. Monteville, B. Métayer, R. Ossikovski, D. Pureur, A +24 dBm two stage hybrid Er doped Er/Yb co-doped double clad fiber amplifier for the full C band, Proc. Eur. Conf. Opt. Commun., P1.25 (Copenhagen, 2002)

 

R. Ossikovski, M. Gay, N. Tallaron, L. Kerdreux, B. Kerrinckx, D. Pureur, P. Even, Analytic model for the Erbium-Ytterbium co-doped silicate fiber amplifier, Proc. SPIE, vol. 4638, 41 (2002)

 

A. Hausmann, G. Weidner, G. Ritter, R. Ossikovski, MOCVD of TiCN thin layers with N2 remote-plasma treatment, MRS Symp. Proc. VLSI XIII, 111 (1998)

 

R. Vanderhagen. S. Cueille, B. Drévillon, R. Ossikovski, Modulated photoellipsometry measurement of GaAs internal field, Proc. SPIE, vol. 2397, 148 (1995)

 

H. Shirai, B. Drévillon, R. Ossikovski, In situ investigation of amorphous silicon / silicon nitride interfaces by infrared ellipsometry, MRS Symp. Proc., vol. 284, 425 (1993)

 

N. Blayo, B. Drévillon, R. Ossikovski, Infrared phase-modulated ellipsometer for in situ characterization of surfaces and thin films, Proc. SPIE, vol. 1681, 116 (1992)

 

 

Technical reports

R. Ossikovski, Estimation of polarization mode dispersion and polarization dependent loss in a cascade of optical components, Corning report LA 331 (FRC, 01/2001)

 

R. Ossikovski, K. Krastev, Comparative study of the magnitude of chromatic, first and second order polarisation mode dispersion in a standard single-mode fibre with and without chromatic dispersion compensation, Corning report LA 312 (FRC, 12/1999)

 

M. Kildemo, S. M. Nilsen, R. Ossikovski, Investigation of measurement procedures to determine physical thickness of lightly doped epitaxial layer on doped c-Si substrates using FTIR-reflectance and ellipsometry, Internal SensoNor Technical Note (1998)

 

 

Editorials

T. Novikova, B. Drévillon, L. Schwartz, P. Validire, A. Nazac, R. Ossikovski, E. Garcia-Caurel, B. Laude-Boulesteix, M. Anastasiadou, M. Losurdo, K. Hinderl, B. Haj Ibrahim, M.-R. Antonelli, A. Pierangelo, S. Deby, S. Roussel, S. Manhas, J. Vizet, D. Pagnoux, S. Bancelin, M.-C. Schanne-Klein, J. Rehbinder, H. Haddad, F. Moreau, J.-C. Vanel, P. Roca i Cabarrocas, V. Tuchin, S. Jacques, Special section guest editorial: Antonello De Martino (1954–2014): in memoriam, J. Biomed Opt. 21, 071101 (2016)

 

O. Arteaga, E. Garcia-Caurel, R. Ossikovski, The Fresnel triprism and the circular polarization of light, Photoniques, Special EOS Issue, March-April 2019, p. 44

Publications HAL: 
FALSE

Hal

Publications HAL: 

{{ type="webpage_from_hal" url="http://hal.univ-grenoble-alpes.fr/Public/afficheRequetePubli.php?auteur_exp=boris,morel&CB_auteur=oui&CB_titre=oui&CB_article=oui&langue=Francais&tri_exp=annee_publi&tri_exp2=typdoc&tri_exp3=date_publi&ordre_aff=TA&Fen=Aff&css=../css/VisuRubriqueEncadre.css}}